Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• been implemented [26], such as in the work of Stark et al. where time-resolved transient forces between the AFM probe and the sample were obtained from the experimental data [27]. This approach was enhanced by Sahin et al. through a “torsional harmonic cantilever” [28], which combined flexural and

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• is a promising approach due to its dynamic nature, robustness, relative simplicity and previous successes. Keywords: atomic force microscopy; spectral inversion; spectroscopy; torsional harmonic cantilever; viscoelasticity; Introduction Besides topographical imaging, a popular application of atomic

• tip located on one of the arms of the “T”, the so-called torsional harmonic cantilever (THC), on which the tip–sample interaction generates a torsional oscillation whose amplitude is enhanced by the soft and highly detectable fundamental torsional frequency. Such enhancement provided a more accurate

• and biological materials, as well as in the study of other rate-dependent phenomena, such as binding or folding/unfolding events in complex biomolecules. Methods The details of the spectral inversion method using the torsional harmonic cantilever have been described in detail elsewhere [8][11], so

Direct monitoring of opto-mechanical switching of self-assembled monolayer films containing the azobenzene group

• Einat Tirosh,
• Enrico Benassi,
• Silvio Pipolo,
• Marcel Mayor,
• Michal Valášek,
• Veronica Frydman,
• Stefano Corni and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2011, 2, 834–844, doi:10.3762/bjnano.2.93

• ]diazene organized in a self-assembled film on Au islands, using atomic force microscopy. Analysis of higher harmonics by means of a torsional harmonic cantilever allowed real-time extraction of mechanical data. Quantitative analysis of elastic modulus maps obtained simultaneously with topographic images